Anyagfizikai Tanszék

Gábor Ribárik

assistant professor

PhD (Budapest, 2009)

Anyagfizikai Tanszék


Office: 4.71


Direct phone: +36-1-372-2805

Phone: +36-1-372-2500 / 6405


E-mail: send message


Personal data:
Date of birth: April 3rd, 1975.
Place of birth: Budapest, Hungary
Status: Married (Orsolya Ribárik)
Children: Balázs (2006), Sára (2008)
Nationality and Citizenship: Hungarian
Address: Eötvös Loránd University, Department of Material Physics
H-1117 Budapest, Pázmány Péter sétány 1/A, Hungary
or H-1518 Budapest, P.O. Box 32, Hungary (letters only)
Phone: +36-1-3722805
Fax: +36-1-372-28-11
PhD in Physics (summa cum laude), Eötvös University, Budapest, Hungary, 2009, adviser: Tamás Ungár.

Physicist (specialized in Solid State Physics) and Astronomer Master's degree, Minor in French-Hungarian technical translator, Eötvös University, Budapest, Hungary, 2001.
2004-: Research assistant at Eötvös University, Department of Material Physics, Budapest, Hungary
1997-: UNIX system manager at the Alfréd Rényi Institute of the Hungarian Academy of Sciences, Budapest, Hungary
1999-2002: UNIX system manager at the Department of Computer Sciences, Eötvös Loránd University, Budapest, Hungary
Deák Ferenc Scholarship (granted by the Hungarian Ministry of Education), 2007-2008.
DEFINO, Aristotle University of Thessaloniki, 2006 (six months).
PhD scholarship at the Department of General Physics, Eötvös University, Budapest, Hungary, 2001-2004.
Conferences, workshops:
DEFINO Thessaloniki, 2007 (oral and poster presentation)
ECM-23 Leuven, 2006 (oral presentation; invited)
EPDIC Prague, 2004 (poster presentation)
ICSMA Budapest, 2003 (poster presentation)
Research interest:
X-ray line profile analysis
Microstructure investigation
Variable stars
Basic Measurements Laboratory
Modern Physics Laboratory
X-ray Laboratory
Experimental Physics (Mechanics, Optics, Thermodynamics and Electrodynamics; demonstrator)
Programming in Java and C++
Foreign languages:
English and French (fluent)
German (weak)
Computer skills:
Software and network management (installing, upgrading and configuring OS and open source software) of Linux/UNIX operating systems (managing a cluster of ~15 servers, ~70 client computers and ~500 users)
Managing various internal and network server programs
Developing locally used software (e.g. user administrative tools or for automatic software synchronization of local linux clients)
Setting up spam-blocking software, e-mail virus scanner and automatic backup of important data
Configuring Linux firewall software, protecting machines against security attacks
Experienced in TeX/LaTeX and HTML (including JAVAScript, PHP+MySQL and CSS)
Programming languages: C/C++, Gnuplot, GNU autoconf/make, Java, Perl, Zsh, can quickly learn any other language on demand
Special skills:
Driving license (1993)


Publications at MTMT

Selected publications of the last five years:

[1] Ungar , T., Ribarik, G., Balogh, L., Salem, A.A., Semiatin, S.L. and Vaughan, G.B.M., Burgers vector population, dislocation types and dislocation densities in single grains extracted from a polycrystalline commercial-purity Ti specimen by X-ray line-profile analysis, Scripta Materialia, 63, 69-72 (2010)

[2] Ungár, T., Glavicic, M.G., Balogh, L., Nyilas, K., Salem, A.A., Ribárik, G. and Semiatin, S.L., T, The use of X-ray diffraction to determine slip and twinning activity in commercial-purity (CP) titanium, Mat. Sci. Eng. A, 493, 79-85 (2008)

[3] Ungár, T., Castelnau, O., Ribárik, G., Drakopoulos, M., Béchade, J. L., Chauveau, T., Snigirev, A., Snigireva, I., Schroer, C. and Bacroix, B., Grain to grain slip activity in plastically deformed Zr determined by X-ray microdiffraction line profile analysis, Acta Materialia, 55, 1117–1127 (2007)

[4] Balogh, L., Ribárik, G. and Ungár, T., Stacking Faults and Twin Boundaries in fcc Crystals Determined by X-ray Diffraction Profile Analysis, J. Appl. Phys., 100, 023512 (2006)

[5] Ribárik, G., Audebrand, N., Palancher, H., Ungár, T., Louër, D., Dislocations and crystallite size distributions in ball-milled nanocrystalline fluorides MF2 (M = Ca, Sr, Ba, Cd) determined by X-ray diffraction-line-profile analysis, J. Appl. Cryst., 38, 912–926, (2005)